Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Measurement Techniques for RF Nanoelectronics

Published

Author(s)

Thomas M. Wallis, Luca Pierantoni

Abstract

In 1882, in a lecture at the University of Leiden, Nobel prize-winner Heike Kammerlingh Onnes coined the motto: “Through Measurement to Knowledge” [1]. In that same lecture, he gave many historical examples of how measurements have fostered insight, including accounts of how Coulomb and Faraday used torsion-balance measurements to learn the fundamental properties of electromagnetic forces. Kammerlingh Onnes’ point is compelling: throughout history, measurements have helped to grow our understanding of electromagnetism and drive innovation. However, there is a complementary process at work, namely that new knowledge and innovations drive the development of new measurement techniques. It is a virtuous cycle: as we go through measurement to knowledge, we also move through knowledge to measurement.
Citation
IEEE Microwave Magazine
Volume
15
Issue
1

Citation

Wallis, T. and Pierantoni, L. (2014), Measurement Techniques for RF Nanoelectronics, IEEE Microwave Magazine, [online], https://doi.org/10.1109/MMM.2013.2292758 (Accessed October 31, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 20, 2014, Updated January 27, 2020