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Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials

Published

Author(s)

T Hemraj-Benny, S Banerjee, S Sambasivan, Daniel A. Fischer, J A. Misewich, S S. Wong
Citation
Small
Volume
2
Issue
1

Citation

Hemraj-Benny, T. , Banerjee, S. , Sambasivan, S. , Fischer, D. , Misewich, J. and Wong, S. (2007), Near-Edge X-ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials, Small, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854311 (Accessed November 4, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2006, Updated October 12, 2021