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PUBLICATIONS

Optical-Fiber Power Meter Comparison between NIST and KRISS

Published

Author(s)

Seungkwan Kim, Keesuk Hong, Dong-Hoon Lee, David J. Livigni, Xiaoyu X. Li, John H. Lehman

Abstract

We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Korea Research Institute of Standards and Science (KRISS- R.O. Korea). We report optical fiber-based power measurements at wavelengths of 1302 nm and 1546 nm. We compare the laboratories' reference standards by means of a temperature-controlled optical trap detector. Measurement results showed the largest difference of less than 2.5 parts in 103, which is within the combined standard (k=1) uncertainty for the laboratories' reference standards.
Citation
Journal of Research (NIST JRES) - 117.019
Report Number
117.019
Volume
117
NIST Pub Series
Journal of Research (NIST JRES)
Pub Type
NIST Pubs

Download Paper

https://doi.org/10.6028/jres.117.019
Local Download

Keywords

international comparison, optical fiber, optical power
Standards and Optical / photometry / laser metrology

Citation

Kim, S. , Hong, K. , Lee, D. , Livigni, D. , Li, X. and Lehman, J. (2012), Optical-Fiber Power Meter Comparison between NIST and KRISS, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/jres.117.019, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=911350 (Accessed January 15, 2025)

Issues

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Created December 20, 2012, Updated October 14, 2021