Humphreys, J.
and Chappell, S.
(1976),
Radiation-hardness testing of electronic devices ::a survey of facility dosimetry practices, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.76-1135
(Accessed November 8, 2024)
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Radiation-hardness testing of electronic devices ::a survey of facility dosimetry practices
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- NBS IR 76-1135
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NBS IR 76-1135
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NIST Pubs
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Created January 1, 1976, Updated May 19, 2023