Bittman, S.
, Lau, J.
and Greene, G.
(2024),
Response to Public Comments: Building a Metrology Exchange to Innovate in Semiconductors (METIS), OTHER, National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.CHIPS.1100-1, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957941
(Accessed August 31, 2024)
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Response to Public Comments: Building a Metrology Exchange to Innovate in Semiconductors (METIS)
Published
Author(s)
, ,
Abstract
In December 2023, NIST released a publication outlining a proposed data-sharing platform, titled "Building a Metrology Exchange to Innovate in Semiconductors (METIS)." The publication was open to public comment from December 2023 to February 2024 to allow for a diversity of people to contribute their viewpoints and to ensure that stakeholders could provide critical feedback to shape the final paper outlining the vision for this data exchange. NIST received numerous comments and identified trends that fell broadly into four specific categories. In this publication, NIST discusses the trends and themes that emerged and provides thematic responses.Citation
OTHER - NIST CHIPS 1100-1
Report Number
NIST CHIPS 1100-1
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
RFI, public comment, semiconductors, microelectronics, metrology, data security, database utility and value, data provenance and traceability, database functionality
Citation
Issues
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Created August 23, 2024