Holtz, M.
, Herzing, A.
and Gorman, B.
(2023),
Scanning Nanobeam Electron Diffraction for Atom Probe Tomography, Microscopy and Microanalysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936601
(Accessed December 3, 2024)
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Scanning Nanobeam Electron Diffraction for Atom Probe Tomography
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Author(s)
Megan Holtz, , Brian Gorman
Citation
Microscopy and Microanalysis
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Journals
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Created July 22, 2023, Updated August 2, 2023