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Displaying 1276 - 1300 of 1560

Reciprocity Relations for On-Wafer Power Measurements

December 5, 1991
Author(s)
Roger Marks, Dylan F. Williams
The implications of expressions relating the forward and reverse transmission coefficients of a waveguide junction derived from the Lorentz reciprocity condition are explored. The two terms in the relation, the phase of the reference impedance in the guide

Benchmark for the Verification of Microwave CAD Software

December 1, 1991
Author(s)
R. Furlow, R. Y. Shimoda, Dylan Williams, Roger Marks, Kuldip Gupta
A set of microstrip structures which constitute a comprehensive benchmark for the verification of microwave Computer Aided Design (CAD) software has been developed in a collaborative effort. The benchmark is designed to exhibit a wide range of physical

Comparison of On-Wafer Calibrations

December 1, 1991
Author(s)
Dylan F. Williams, Roger Marks, A. Davidson
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration

Transmission Line Capacitance Measurement

September 1, 1991
Author(s)
Dylan F. Williams, Roger Marks
The capacitance of coplanar lines is measured with two new techniques, one utilizing the resistance of the line and the other that of a resistor embedded in the line. The results of both measurements agree closely with calculations. A technique for
Displaying 1276 - 1300 of 1560