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Displaying 1351 - 1375 of 2606

High Temperature Seebeck Coefficient Metrology

December 22, 2010
Author(s)
Joshua B. Martin, Terry M. Tritt, Winnie K. Wong-Ng, Ctirad Uher
We present an overview of the challenges and practices of thermoelectric metrology at high temperature (300 K-1300 K). The Seebeck coefficient, when combined with thermal and electrical conductivity, is a useful property measurement for evaluating the

Combined scanning probe and light scattering characterization of multi-stage self-assembly of targeted liposome-based delivery systems

December 21, 2010
Author(s)
Natalia Farkas, John A. Dagata, Chengli Yang, Antonina Rait, Kathleen Pirollo, Esther Chang
The mean size and size distribution of a targeted nanoparticle delivery system (NDS) strongly influences the intrinsic stability and functionality of this molecular complex, affects its performance as a systemic drug delivery platform, and ultimately

Scanning Probe Microscope Dimensional Metrology at NIST

December 21, 2010
Author(s)
John A. Kramar, Ronald G. Dixson, Ndubuisi G. Orji
Scanning probe microscopy (SPM) dimensional metrology efforts at the U.S. National Institute of Standards and Technology are reviewed. The main SPM instruments for realizing the International System of Units (SI) are the Molecular Measuring Machine, the

Benchmarks, Performance Evaluation and Contests for 3D Shape Retrieval

December 20, 2010
Author(s)
Afzal A. Godil, Zhouhui Lian, Helin Dutagaci
Benchmarking of 3D Shape retrieval allows developers and researchers to compare the strengths of different algorithms on a standard dataset. Here we discuss the different steps involved in developing a benchmark and some of the issues involved. We then

Common Reference Channels for Metrological Comparability

December 20, 2010
Author(s)
Ruediger Kessel, Tim Hewison
In this article we discuss the effect of the choice of reference during calibration on later use of the calibrated results, and how a reference should be chosen to support later use of the data. Starting from the concept of metrological comparability we

GEOMETRICAL MEASUREMENTS OF NIST SRM ROCKWELL HARDNESS DIAMOND INDENTERS

November 21, 2010
Author(s)
Jun-Feng Song, Samuel R. Low III, Xiaoyu A. Zheng
The geometric parameters of 28 candidate Standard Reference Material (SRM) Rockwell hardness diamond indenters are calibrated by an automated system recently developed at the National Institute of Standards and Technology (NIST). The calibration results

MEMS Microhotplate Temperature Sensor BIST: Importance and Applications

November 3, 2010
Author(s)
Muhammad Y. Afridi, Jon C. Geist
This paper describe the importance of temperature sensor built-in self test (BIST) for microhotplate based sensors. It shows possible ways to implement BIST functionality for microhotplate temperature sensor, including Resistance Temperature Detectors (RTD

Instabilities as a Measurement Tool for Soft Materials

November 2, 2010
Author(s)
John A. Howarter, Christopher Stafford
Mechanical instabilities such as wrinkles, creases, and folds have long been viewed as a source of frustration for engineers and often a point of curiosity among scientists. Scientists aspire to understand the underlying physics behind the formation of

Noise-Parameter Measurements with a Reflection Type Phase Shifter

November 1, 2010
Author(s)
Dazhen Gu, Dave K. Walker, James P. Randa
We report a miniaturized phase shifter operating in the frequency range from 5 GHz to 7 GHz for noise-parameter extraction. Such a tunable solid-state unit represents a significant reduction in the size and mass as a source-pull component, compared to its

Assessing Library Performance Using the Baldrige Criteria for Performance Excellence: Framework and Systems that Focus on Results and Ensure Sustainability

October 25, 2010
Author(s)
Susan L. Makar, Mary D. Coraggio, Mylene S. Ouimette, Barbara P. Silcox
Successful management of organizational performance requires interconnected systems that link goals and strategies with customer and stakeholder requirements, key processes, and measures. This systems-oriented approach ensures consistency across plans

Maintainers Manual for Version 2.2.1 of the NIST DMIS Test Suite

October 25, 2010
Author(s)
Thomas R. Kramer, John A. Horst
This manual is a maintainers manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The manual is
Displaying 1351 - 1375 of 2606