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NIST Authors in Bold

Displaying 1501 - 1525 of 2606

Interoperability and the DMIS experience

October 30, 2009
Author(s)
John A. Horst
Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and

NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000

October 30, 2009
Author(s)
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively used in the characterization of lattice distortion in thin single, epitaxial crystal layers on

Report on the Key Comparison CCPR K2.a-2003

October 30, 2009
Author(s)
Yoshihiro Ohno, Steven W. Brown, Thomas C. Larason
Under the framework of Mutual Recognition Arrangement (MRA) for national measurements standards and for calibration and measurement certificates issued by National Metrology Institutes (NMIs) signed in 1999, an international comparison of spectral

Mathematical Metrology for Evaluating a 6DOF Visual Servoing System

October 8, 2009
Author(s)
Tommy Chang, Tsai H. Hong, Milli Shah, Roger D. Eastman
In this paper we develop the best homogeneous matrix trans- formation to fit two streams of dynamic six-degree-of-freedom (6DOF) data for evaluating perception systems using ground truth. In particular, we compare object position and orien- tation results

A Combined Fit of Total Scattering and Extended X-ray Absorption Fine Structure Data for Local-Structure Determination in Crystalline Materials

October 5, 2009
Author(s)
Igor Levin, Victor L. Krayzman, Joseph C. Woicik, Terrell A. Vanderah, M. G. Tucker, Thomas Proffen
Reverse Monte Carlo (RMC) refinements of local structure using a simultaneous fit of x-ray/neutron total scattering and EXAFS data were developed to incorporate an explicit treatment of both single- and multiple-scattering contributions to EXAFS. The

Influence of room temperature control system on AFM imaging

October 1, 2009
Author(s)
Joseph Fu, Wei Chu, Theodore V. Vorburger
As technology progresses, the control of environment for experiments is also getting more sophisticated; such as the control of lab temperature and vibration. Temperature controlled within ± 0.25° C for a general purpose lab is common place. We illustrate

The Dimensional Markup Language Specification for Inspection Results Data

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results files are

Update on DMIS Certification

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. The

A Novel Method to Covalently Functionalize Carbon Nanotubes with Isocyanates

September 30, 2009
Author(s)
Tinh Nguyen, Aline Granier, Kristen L. Steffens, Hajin Lee, Naomi Eidelman, Jonathan W. Martin
We have developed a novel method to covalently functionalize carbon nanotubes (CNTs) that carry free isocyanate (N=C=O) groups. NCO-functionalized CNTs (NCO-fCNTs) are very desirable, because the NCO group is highly reactive with hydrogen-active groups

Gauging the Repeatability of 3D Imaging Systems by Sphere Fitting

September 30, 2009
Author(s)
Marek Franaszek, Geraldine S. Cheok, Kamel S. Saidi
Multiple scans of the same object acquired with 3D imaging system (e.g., laser scanner) in the same experimental conditions could provide valuable information about the instrument s performance (e.g., stability, existence of bias, measurement error)

MEASUREMENTS FOR MECHANICAL RELIABILITY OF THIN FILMS

September 23, 2009
Author(s)
David T. Read, Alex Volinsky
This paper reviews techniques for measurement of basic mechanical properties of thin films. Emphasis is placed on the adaptations needed to prepare, handle, and characterize thin films, and on adaptations of fracture mechanics for adhesion strength. The

Unified Model for Bulk Acoustic Wave Resonators’ Nonlinear Effects

September 20, 2009
Author(s)
Eduard Rocas, Juan C. Collado Gomez, James C. Booth, Enrique Iborra, Robert Aigner
We present a nonlinear model for Bulk Acoustic Wave resonators that combines different sources of nonlinearity, using device-independent material specific parameters, to predict the intermodulation and harmonics generation. The actual model accounts for

GEOMETRIC MEASUREMENT COMPARISONS FOR ROCKWELL DIAMOND INDENTERS

September 6, 2009
Author(s)
Jun-Feng Song, Samuel R. Low III, Xiaoyu A. Zheng
In the uncertainty budget of Rockwell C hardness (HRC) tests, geometric error of the Rockwell diamond indenter is a major contributor. The geometric calibration of Rockwell diamond indenters has been a key issue for Rockwell hardness standardization. The

Overview of the TAC 2008 Update Summarization Task

September 4, 2009
Author(s)
Hoa T. Dang, Karolina K. Owczarzak
The summarization track at the Text Analysis Conference (TAC) is a direct continuation of the Document Understanding Conference (DUC) series of workshops, focused on providing common data and evaluation framework for research in automatic summarization. In

Analog BIST Functionality for Microhotplate Temperature Sensors

September 1, 2009
Author(s)
Muhammad Y. Afridi, Christopher B. Montgomery, Elliott cooper-Balis, Stephen Semancik, Kenneth G. Kreider, Jon C. Geist
In this paper we describe a novel microhotplate temperature sensor calibration technique suitable for Built-In Self Test. The technique only requires short-term temperature stability from the four-wire polysilicon heater/temperature sensors that are
Displaying 1501 - 1525 of 2606