U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1576 - 1600 of 2606

Report on Acceleration Comparison SIM.AUV.V-K1 - Draft B

March 20, 2009
Author(s)
David J. Evans, Adriana Hornikova, Stefan D. Leigh, Andrew L. Rukhin, William E. Strawderman
The first regional key comparison in vibration conducted under the auspices of the Inter-American System of Metrology (SIM) was begun in 1996. The comparison was registered with the International Bureau of Weights and Measures (BIPM) through the

Polymerization Stress Development in Dental Composites: Effect of Cavity Design Factor

March 13, 2009
Author(s)
Joseph M. Antonucci, Anthony A. Giuseppetti, Justin N. O'Donnell, Gary E. Schumacher, Drago Skrtic
Objective: To assess the effect of the cavity design factor (C-factor) on polymerization stress development (PSD) in resin composites. Methods: An experimental resin (BT resin) was prepared, which contained 2,2-bis[p-(2 hydroxy-3 -methacryloxypropoxy

Energy Efficient Lighting - Solid State Luminaires (Handbook 150-1A)

February 27, 2009
Author(s)
C Cameron Miller, Lawrence I. Knab, Ambler Thompson, Jon M. Crickenberger
NIST Handbook 150-1A presents technical requirements and guidance for the accreditation of laboratories under the National Voluntary Laboratory Accreditation Program (NVLAP) Energy Efficient Lighting/Solid State Lighting program. It is intended for

SRM Spotlight

February 18, 2009
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers

January 30, 2009
Author(s)
Balasubramanian Muralikrishnan, Daniel S. Sawyer, Christopher J. Blackburn, Steven D. Phillips, Bruce R. Borchardt, William T. Estler
Small and unintended offsets, tilts, and eccentricity of the mechanical and optical components in laser trackers introduce systematic errors in the measured spherical coordinates (angles and range readings), and possibly in the calculated lengths of

Dimensional measurement traceability of 3D imaging data

January 19, 2009
Author(s)
Steven D. Phillips, Craig M. Shakarji, Michael Krystek, K Summerhays
This paper discusses the concept of metrological traceability to the SI unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challenges to

Advice from the CCL on the use of unstabilized lasers as standards of wavelength: the helium-neon laser at 633 nm

January 1, 2009
Author(s)
Jack A. Stone Jr., Jennifer Decker, Patrick Gill, Andrew Lewis, Patrick Juncar, Daniele Rovera, Miguel Villiseid
The Consultative Committee for Length has recommended that red (633 nm) unstabilized Helium-Neon lasers, operating on the 3s2¿_2p4 transition, should be included in the list of standard frequencies for realization of the meter. This article discusses

Character contrast

January 1, 2009
Author(s)
Edward F. Kelley
Measurement of a small black area on a white electronic display screen is often accompanied by serious contamination from veiling glare in the detector. The black measurement can be thousands of percent in error. Character-stroke-contrast or small-area

Maintenance and Validation of Liquid-in-Glass Thermometers

January 1, 2009
Author(s)
Christina D. Cross, Dean C. Ripple, Gregory F. Strouse
Liquid-in-glass thermometers are pervasive in use throughout industry and provide a convenient method for measuring temperature over for a broad range of applications with reasonable stability and accuracy. However, liquid-in-glass thermometers are subject

Scatterfield Optical Imaging for sub-10 nm Dimensional Metrology

January 1, 2009
Author(s)
Richard M. Silver
Recent developments in optical microscopy promise to advance optical metrology and imaging to unprecedented levels through theoretical and experimental development of a new measurement technique called "scatterfield optical imaging". ". Current metrology

Design and testing of a software feedback loop for RF power leveling

December 12, 2008
Author(s)
Xiaohai Cui, Thomas P. Crowley
We have developed a software feedback loop that stabilizes the RF power input in calorimetric measurements to better than 30 ppm. In this system, a bolometric sensor with a Type IV power meter is used to detect the power. Feedback is provided to the AM

Wideband measurement of extreme impedance with a multistate reflectometer

December 12, 2008
Author(s)
Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A. Ginley, Thomas M. Wallis, Atif A. Imtiaz, Pavel Kabos
Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We

2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)

December 10, 2008
Author(s)
Ronald G. Dixson, Jon R. Pratt, Vincent A. Hackley, James E. Potzick, Richard A. Allen, Ndubuisi G. Orji, Michael T. Postek, Herbert S. Bennett, Theodore V. Vorburger, Jeffrey A. Fagan, Robert L. Watters
A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National workshop

Blind estimation of general tip shape in AFM imaging

December 1, 2008
Author(s)
Fenglei Tian, Xiaoping Qian, John S. Villarrubia
The use of flared tip and bi-directional servo control in some recent atomic force microscopes (AFM) has made it possible for these advanced AFMs to image structures of general shapes with undercuts and reentrant surfaces. Since AFM images are distorted
Displaying 1576 - 1600 of 2606