Publications

Displaying 76 - 100 of 216

X-Ray Spectrometry and Spectrum Image Mapping at Output Count Rates Above 100 kHz with a Silicon Drift Detector on a Scanning Electron Microscope

September 1, 2005

Author(s)

Dale E. Newbury

A third generation silicon drift detector (SDD), a silicon multicathode detector (SMCD), was tested as an analytical x-ray spectrometer on a scanning electron microscope. The resolution, output count rate, and spectral quality were tested as a function of

Blunders in Automatic Qualitative Analysis (Peak Identification) for Energy Dispersive X-Ray Spectrometry: The Low Voltage Microanalysis Situation

August 1, 2005

Author(s)

Dale E. Newbury

Automatic qualitative analysis for peak identification is a standard feature of virtually all modern computer-aided analysis software for energy dispersive x-ray spectrometry with electron excitation. Testing of recently installed systems from four

Electron Probe Microanalysis with Cryogenic Detectors

July 9, 2005

Author(s)

Dale E. Newbury, Kent D. Irwin, Gene C. Hilton, David A. Wollman, John A. Small, John M. Martinis

Electron probe x-ray microanalysis is based upon the use of a focused, high current density electron beam, 5 keV to 30 keV in energy, to excite characteristic x-rays from a picogram mass of a solid target. X-ray spectral measurements are currently

High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials

March 21, 2005

Author(s)

Dale E. Newbury, J H. Scott, Scott A. Wight, J T. Armstrong, John A. Small

Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectrometry

"Derived Spectra" Software Tools for Detecting Spatial and Spectral Features in Spectrum Images

January 1, 2005

Author(s)

Dale E. Newbury, David S. Bright

Electron Probe Microanalysis

January 1, 2005

Author(s)

Dale Newbury, Kent D. Irwin, Gene C. Hilton, David A. Wollman, John A. Small, John M. Martinis

Maximum Pixel Spectrum: A New Tool For Detecting And Recovering Rare, Unanticipated Features From Spectrum Image Data Cubes

November 1, 2004

Author(s)

David S. Bright, Dale E. Newbury

A new software tool, the Maximum Pixel Spectrum detects rare events within a spectrum image data cube, such as that generated with electron-excited energy dispersive x-ray spectrometry (EDS) in a scanning electron microscope. The Maximum Pixel Spectrum is

Characterization of Colloidal Material Fom Natural and Engineered Waters Investigating Structure-Function Relationships Through Microanalysis

February 1, 2004

Author(s)

Richard D. Holbrook, Scott A. Wight, Dale E. Newbury

The fate, transport and ultimate impact of toxic compounds in aquatic systems is governed by their distribution between the particulate, colloidal and dissolved phases. Colloids, conventionally defined as solid material between 1 nm and 1 m in size

Improving the Sensitivity of Electron Beam Microanalytical Techniques by Enhanced X-Ray Spectrometry: X-Ray Microcalorimetry, Silicon Drift Detector Energy Dispersive X-ray Spectrometry, and Polycapillary X-ray Optics

December 25, 2003

Author(s)

Dale E. Newbury

The microcalorimeter energy dispersive x-ray spectrometer, the silicon drift detector (SDD), and polycapillary x-ray optics are recent developments that have significantly advanced analytical x-ray spectrometry for electron beam instruments. The

A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems

December 31, 2002

Author(s)

John A. Small, Dale Newbury, John Henry J. Scott, L. King, Sae Woo Nam, Kent D. Irwin, Steven Deiker, Shaul Barkan, Jan Iwanczyk

NIST, Gaithersburg has recently installed a first generation silicon drift detector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer (υcal-EDS) on a JEOL 840 SEM, as shown in Fig. 1. [1,2] The instrument

A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems

December 1, 2002

Author(s)

John A. Small, Dale E. Newbury, J H. Scott, L R. King, Sae Woo Nam, Kent D. Irwin, Steven Deiker, S Barkan, E Iwaniczko

NIST, Gaithersburg has recently installed a first generation silicon drift dectector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer ( cal-EDS) on a JEOL 840 SEM1 , as shown in Fig.1. [1,2] The

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy

December 1, 2002

Author(s)

Dale E. Newbury

Low voltage x-ray microanalysis, defined as being performed with an incident beam energy less than or equal to 5 keV, can achieve spatial resolution, laterally and in depth, of 100 nm or less, depending on the exact selection of beam energy and the

X-Ray Microanalyses in the Variable Pressure (Environmental) Scanning Electron Microscopy

December 1, 2002

Author(s)

Dale E. Newbury

X-ray spectra measured on uncoated insulators in the low voltage scanning electron microscope (LVSEM) and the variable pressure environmental scanning electron microscope (VP-ESEM) are subject to artifacts due to charging effects despite the capability of

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