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Search Publications by: Dale E. Newbury (Assoc)

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Displaying 126 - 150 of 216

Microcalorimeter EDS: Benefits and Drawbacks

August 1, 2000
Author(s)
David A. Wollman, Dale Newbury, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
The commercial introduction of high-count-rate, near-room-temperature silicon drift detectors (presently available) and high-energy-resolution cryogenic microcalorimeters (forthcoming) is an exciting development in x-ray microanalysis, in which detector

Improving the Accuracy of Particle Analysis

July 1, 2000
Author(s)
John A. Small, J R. Michael, Dale E. Newbury
Historically the procedures for the quantitative X-ray analysis of particles in the electron probe have been similar to the methods used for bulk electron probe samples.The main difference was that corrections had to be made to the experimental k-ratios or

Microcalorimeter Energy-Dispersive Spectrometry Using a Low Voltage Scanning Electron Microscope

July 1, 2000
Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis, Dale Newbury
We describe the current performance of the prototype microcalorimeter energy-dispersive spectrometer (5cal EDS) developed at NIST for X-ray microanalysis. We show that the low-energy 5cal EDS, designed for operation in the energy range 0.2-2 keV, offers

The Approaching Revolution in X-Ray Microanalysis: The Microcalorimeter Energy Dispersive Spectrometer

June 1, 2000
Author(s)
Dale E. Newbury, David A. Wollman, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis
We have developed a high-resolution energy-dispersive x-ray spectrometer (EDS) based on cryogenic microcalorimeter x-ray detectors for use in x-ray microanalysis. With an energy resolution of 3 eV at 1.5 keV, count rate of {approximately} 500 s -1, and an

Journal of Research of the National Institute of Standards and Technology

January 1, 2000
Author(s)
Dale E. Newbury, Ryna B. Marinenko
The Journal of Research of the National Institute of Standards and Technology reports NIST research and development in those disciplines of the physical and engineering sciences in which the Institute is active. These include physics, chemistry

Quantitative Electron Probe Microanalysis of Rough, Bulk Samples

January 1, 2000
Author(s)
Dale E. Newbury
Surface roughness degrades the accuracy of quantitative electron probe x-ray microanalysis through the action of geometric effects on x-ray production and absorption. Measurements of rough surfaces produced on NIST microhomogeneous SRMs will be used to

Energy Dispersive X-Ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis

December 1, 1999
Author(s)
Dale E. Newbury, David A. Wollman, Kent D. Irwin, Gene C. Hilton, John M. Martinis
The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the

Parallel Monte Carlo Simulation Using Desktop Computers

August 1, 1999
Author(s)
J H. Scott, Robert L. Myklebust, Dale Newbury
Monte Carlo simulation of electron scattering in solids has proven valuable to electron microscopists for many years. The electron trajectories, x-ray generation volumes, and scattered electron signals produced by these simulations are used in quantitative