U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Mark D. Vaudin (Assoc)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 76 - 92 of 92

Phase Relationships and Phase Formation in the System BaF 2 -BaO-Y 2 O 3 -CuO x -H 2 O

January 1, 2002
Author(s)
Winnie K. Wong-Ng, Lawrence P. Cook, J Suh, Igor Levin, Mark D. Vaudin, Ron Feenstra, James P. Cline
The interplay of melting equilibria and reaction kinetics is important during formation of the Ba2YCu3O6+x (Y-213) phase from starting materials in the quaternary reciprocal system Ba,Y,Cu//O,F. For experimental investigation of the process we are using a

Crystallographic Texture in Ceramics and Metals

December 1, 2001
Author(s)
Mark D. Vaudin
Preferred crystallographic orientation, or texture, occurs almost universally, both in natural and man-made systems. Many components and devices in electronic and magnetic systems are fabricated from materials that have crystallographic texture. The

Electrochemical Properties of Nanocrystalline Cadmium Stannate Films

August 1, 2001
Author(s)
Gintaras Valincius, Vytas Reipa, V L. Vilker, John T. Woodward IV, Mark D. Vaudin
Electrochemical properties of the sol-gel nanocrystalline cadmium tin oxide electrodes (CTO) were investigated in 0.2 M potassium chloride buffered at pH 7.4 with phosphate. Films were found to be n-type degenerate semiconductors with charge carrier levels

Workshop on Texture in Electronic Applications

May 1, 2001
Author(s)
Mark D. Vaudin, Debra L. Kaiser
A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for discussion of a broad spectrum of texture-related issues of interest to academic,government and

Texture Plus

February 1, 2001
Author(s)
Mark D. Vaudin
TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained on a powder x-ray diffractometer. The required data include an x-ray theta-2theta scan of a Bragg

Cu Electrodeposition for On-Chip Interconnections

January 1, 2001
Author(s)
Gery R. Stafford, Thomas P. Moffat, V D. Jovic, David R. Kelley, John E. Bonevich, Daniel Josell, Mark D. Vaudin, N G. Armstrong, W H. Huber, A Stanishevsky
The electrochemical behavior of copper in copper sulfate - sulfuric acid, containing various combinations of NaCl, sodium 3 mercapto-1 propanesulfonate (MPSA), and polyethylene glycol (PEG) is examined. The i-E deposition characteristics of the

Comparative of Texture Analysis Techniques for Highly Oriented a-Al 2 O 3

August 1, 2000
Author(s)
M M. Seabugh, Mark D. Vaudin, James Cline, G L. Messing
Texture measurements were performed on liquid phase sintered alumina textured by a templated grain growth process. Texture distributions were measured using four techniques (x-ray pole figure, rocking curve, and Rietveld refinement and stereological

Correlation of the optical gap of (Ba,Sr)yTiO 2+y thin films with film composition

June 1, 2000
Author(s)
L D. Rotter, Mark D. Vaudin, John E. Bonevich, Debra L. Kaiser, S 0. Park
A series of (Ba 1-x,Sr x)yTiO 2+y films with a wide range of y and x < 0.07 was grown by metalorganic chemical vapor deposition. The composition of the films was determined by wavelength dispersive x-ray spectrometry. Transmission spectra were measured and

Measuring Bimodal Crystallographic Texture in Ferroelectric PZT Thin Films

February 1, 2000
Author(s)
Mark D. Vaudin, G R. Fox
A powder x-ray diffraction method has been developed to measure the volume fraction of (111), (100), and randomly oriented PZT in 200 nm thick films used for FRAM applications. The integrated and peak intensities of 100, 110, 200 and 222 Bragg peaks from

Determination of Texture From Individual Grain Orientation Measurements

November 17, 1999
Author(s)
J Blendell, Mark D. Vaudin, Lin-Sien H. Lum
We present a technique for determining the texture of a polycrystalline material based on the measurement of the orientation of a number of individual grains. We assume that the sample has fiber texture and that the texture can be characterized by a