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Search Publications by: Mark D. Vaudin (Assoc)

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Displaying 76 - 100 of 184

Equi-Axed Grain Formation in Electrodeposited Sn-Bi

December 29, 2007
Author(s)
E Sandnes, Maureen E. Williams, Mark D. Vaudin, Gery R. Stafford
Sn is widely used as a coating in the electronics industry because it provides excellent solderability, ductility, electrical conductivity and corrosion resistance. However, Sn whiskers have been observed to grow spontaneously from Sn electrodeposits and

Growth of Silicon Carbide Nanowires by a Microwave Heating-Assisted Physical Vapor Transport Using Group VIII Metal Catalysts

November 13, 2007
Author(s)
Siddarth Sundaresan, Albert Davydov, Mark D. Vaudin, Igor Levin, James E. Maslar, Yong-lai Tian, M V. Rao
SiC nanowires are grown by a novel catalyst-assisted sublimation-sandwich (SS) method. This involves microwave heating-assisted physical vapor transport from a source 4H-SiC wafer to a closely positioned substrate 4H-SiC wafer. The substrate wafer is

Texture and Phase Analysis of a Ca 3 Co 4 O 9 / Si (100) Thermoelectric Film

July 26, 2007
Author(s)
Winnie K. Wong-Ng, Y F. Hu, Mark D. Vaudin, B He, Makoto Otani, Nathan Lowhorn, Q Li
This paper reports the texture analysis as well as the identification of two crystalline phases between a thin film of monoclinic Ca3Co4O9 and a cubic (100) Si substrate, using a diffractometer equipped with a 2-dimensional area detector. No reflections

Electrodeposition of Bismuth From Nitric Acid Electrolyte

April 2, 2007
Author(s)
E Sandnes, Maureen E. Williams, Ugo Bertocci, Mark D. Vaudin, Gery R. Stafford
The electrodeposition of Bi from acidic nitrate solution was examined. Bismuth deposition was determined to be quasi-reversible on Au, with a current efficiency of 100%, based on integration of deposition and stripping voltammetric waves. No interference

Phase Relations in the Ba-Y-Cu-O Films on SrTiO3 for the -Ex Situ BaF2- Process

March 5, 2007
Author(s)
Winnie K. Wong-Ng, Makoto Otani, Lawrence P. Cook, Mark D. Vaudin, James P. Cline, Ron Feenstra, T G. Holesinger
In situ x-ray diffraction was used to establish the phase relations in high-Tc superconductor Ba–Y– Cu–O films grown on SrTiO3 through the ex situ BaF2 process. These relations differ from bulk equilibrium phase assemblages in the BaO–Y2O3–CuOx system. In