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Search Publications by: John S. Villarrubia (Fed)

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Displaying 101 - 106 of 106

Progress in Tip Modeling

January 1, 1995
Author(s)
John S. Villarrubia
Progress since the last Industrial Applications of Scanned Probe Microscopy workshop in the estimation of tip geometries for scanned probe microscopes is discussed. A new method which does not require calibration of the tip characterizers has been

A Study of the Surface Texture of Polycrystalline Phosphor Films Using AFM

January 1, 1994
Author(s)
Zsolt R?vay, J Schneir, D Brower, John S. Villarrubia, Joseph Fu, et al
Stimulable phosphor thin films are being investigated for use as optical data storage media. We have successfully applied atomic force microscopy (AFM) to the measurement of the surface texture of these films. Determination of the surface texture of the

Morphological Estimation of Tip Geometry for Scanned Probe Microscopy

January 1, 1994
Author(s)
John S. Villarrubia
Morphological constraints inherent in the imaging process limit the possible shapes of the tip with which any given tunneling microscope or atomic force microscope image could have been taken. Broad tips do not produce narrow image protrusions. Therefore