U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Thomas A. Germer (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 251 - 275 of 384

Polarized Light Scattering From Metallic Particles on Silicon Wafers

December 1, 2001
Author(s)
Jae H. Kim, S H. Ehrman, George W. Mulholland, Thomas Germer
Polarized light scattering by monodisperse copper and gold spheres, having diameters ranging from 96 nm to 205 nm deposited on silicon substrates were measured using visible light. The results are compared to an exact theory for scattering by a sphere on a

SCATMECH: Polarized Light Scattering C++ Class Library (Version 2.00)

December 1, 2001
Author(s)
Thomas A. Germer
A C++ object class library has been developed to distribute models for polarized light scattering from surfaces. It is the intent of this library to allow researchers in the light scattering community to fully utilive the models described in several

Large-Angle In-Plane Light Scattering From Rough Surfaces: Comment

November 1, 2001
Author(s)
Thomas A. Germer
A recent paper by Karabacak et al., which discussed the scattering from rough surfaces in directions out of the plane of incidence, exhibited an error in the derivation of a polarization factor. An asymmetry in the scattering function for directions out of

Modeling the Appearance of Special Effect Pigment Coatings

October 1, 2001
Author(s)
Thomas A. Germer, Maria E. Nadal
Metallic and pearlescent coatings are becoming increasingly important in automotive, currency, and cosmetic applications. These coatings consist of metallic or dielectric platelets suspended in a binder, and are often applied between a pigmented underlayer

Characterizing Interfacial Roughness by Light Scattering Ellipsometry

June 1, 2001
Author(s)
Thomas A. Germer
The polarization of light scattered by oxide films thermally grown on photolithographically-generated microrough silicon surfaces was measured as functions of scattering angle. Using the predictions of first-order vector perturbation theory for scattering