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Search Publications by: Zachary H. Levine (Fed)

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Displaying 176 - 200 of 296

Mass Absorption Coefficient of Tungsten and Tantalum

September 1, 2002
Author(s)
Zachary H. Levine
Web page for the Computational Material Science Network(administered at U. Washington) based on the following WERB-approvedmanuscripts:Z.~H.~Levine, S.~Grantham, C.~Tarrio,D.~J.~Paterson, I.~McNulty, T.~M.~Levin,A.~L.~Ankudinov, and J.~J.~Rehr,``Mass

Diffractive Optics From Self-Assembled DNA

August 1, 2002
Author(s)
Zachary H. Levine
An algorithm is presented for assembling tiles into a variable spaced grating, the one-dimensional analogue of Fresnel zone plate. The algorithm supports blazing. The x-ray properties of such a grating, assumed to be constructed form DNA are estimated

The Trouble with Calcium Floride

March 1, 2002
Author(s)
John H. Burnett, Zachary H. Levine, Eric L. Shirley
We discuss the intrinsic birefringence of calcium fluoride and othercrystalline materials that may be used in the optics for 193nm and 157nmlithography, including the characterization of the effect and itsimplications for performance of lens systems at

Mass Absorption Coefficient of Tungsten for 1600-2100 eV

February 1, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
The transmission of soft x-rays with photon energies from 1606 eV to 2106 eV was measured for tungsten using thin film samples and a synchrotron source. This region includes the M IV and M V edges. The two tungsten films had thicknesses of 107.7 10 nm and

Mass Absorption Coefficient of Tungsten, 1600 eV to 2100 eV

January 24, 2002
Author(s)
Zachary H. Levine, S Grantham, I McNulty
The transmission of soft x-rays with photon energies from 1606 eV to 2106 eV was measured for tungsten using thin film samples and a synchrotron source. This region includes the M IV and M V edges. The two tungsten films had thicknesses of 107.7 10 nm and

Excitonic Effects on Optical Second-Harmonic Polarizabilities of Semiconductors

January 1, 2002
Author(s)
E K. Chang, Zachary H. Levine, Eric L. Shirley
We present an ab initio many-body formalism for computing the frequency-dependent second-harmonic polarizability of semiconductor materials that includes both local-field and excitonic effects. We calculate the second-harmonic polarizability for AIP, AIAs