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Search Publications by: R Joseph Kline (Fed)

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Displaying 101 - 125 of 174

Interface Engineering to Control Magnetic Field Effects of Organic-Based Devices by Using a Molecular Self-Assembled Monolayer

June 26, 2014
Author(s)
Hyuk-Jae Jang, Sujitra J. Pookpanratana, Alyssa N. Brigeman, Regis J. Kline, James I. Basham, David J. Gundlach, Christina A. Hacker, Oleg A. Kirillov, Oana Jurchescu, Curt A. Richter
Organic semiconductors hold immense promise for the development of a wide range of innovative devices with their excellent electronic and manufacturing characteristics. Of particular interest are non-magnetic organic semiconductors that show unusual

Morphological origin of charge transport anisotropy in aligned polythiophene thin films

June 11, 2014
Author(s)
Brendan T. O'Connor, Obadiah G. Reid, Xinran Zhang, Regis J. Kline, Lee J. Richter, David J. Gundlach, Dean DeLongchamp, Michael F. Toney, Nikos Kopidakis, Garry Rumbles
The morphological origin of anisotropic charge transport in uniaxially strain aligned poly(3-hexylthiophene) (P3HT) films is investigated. The macroscale field effect mobility anisotropy is measured in an organic thin film transistor (OTFT) configuration

Confinement-Driven Increase in Ionomer Thin-Film Modulus

April 28, 2014
Author(s)
Kirt A. Page, Ahmet Kusoglu, Christopher M. Stafford, Sangcheol Kim, Regis J. Kline, Adam Weber
Ion-conductive polymers, or ionomers, are critical materials for a wide range of electrochemical technologies. For optimizing the complex, heterogeneous structures in which they occur, there is a need to elucidate the governing structure/function

Optimizing Hybrid Metrology through a Consistent Multi-Tool Parameter Set and Uncertainty Model

April 14, 2014
Author(s)
Richard M. Silver, Bryan Barnes, Nien F. Zhang, Hui Zhou, Andras Vladar, John S. Villarrubia, Regis J. Kline, Daniel Sunday, Alok Vaid
There has been significant interest in hybrid metrology as a novel method for reducing overall measurement uncertainty and optimizing measurement throughput (speed) through rigorous combinations of two or more different measurement techniques into a single

10 nm Three-Dimensional CD-SEM Metrology

April 10, 2014
Author(s)
Andras Vladar, John S. Villarrubia, Bin Ming, Regis J. Kline, Jasmeet Chawla, Scott List, Michael T. Postek
The shape and dimensions of a challenging pattern have been measured using a model-based library scanning electron microscope (MBL SEM) technique. The sample consisted of a 4-line repeating pattern. Lines were narrow (10 nm), asymmetric (different edge

3D X-ray Metrology for Block Copolymer Lithography Line-Space Patterns

July 15, 2013
Author(s)
Daniel F. Sunday, Matthew R. Hammond, Chengqing C. Wang, Wen-Li Wu, Regis J. Kline, Gila E. Stein
We report on the development of a new measurement method, resonant critical-dimension small-angle x-ray scattering (CD-SAXS), for the characterization of the buried structure of block copolymers (BCP) used in directed self assembly (DSA). We use resonant

Critical Dimension small angel X-ray scattering measurements of FinFET and 3D memory structures

April 8, 2013
Author(s)
Regis J. Kline, Daniel F. Sunday, Chengqing C. Wang, Wen-Li Wu, Charlie Settens, Bunday Benjamin, Brad Thiel, Matyi Richard
Critical dimension small angle X-ray scattering (CD-SAXS) has been identified as a potential solution for measurement of nanoscale lithographic features by interrogating structures with sub-nanometer wavelength radiation in transmission geometry. The most

Intercomparison between optical and x-ray scatterometry measurements of FinFET structures

April 8, 2013
Author(s)
Paul Lemaillet, Thomas Germer, Regis J. Kline, Daniel Sunday, Chengqing C. Wang, Wen-Li Wu
In this paper, we present a comparison of profile measurements of vertical field effect transistor (FinFET) fin arrays by optical critical dimension (OCD) metrology and critical dimension small angle X-ray scattering (CD-SAXS) metrology. Spectroscopic

Vertically Segregated Structure and Properties of small molecule-polymer blend semiconductors for organic thin film transistors

August 27, 2012
Author(s)
Nayool Shin, Dean DeLongchamp, Jihoon Kang, Regis J. Kline, Lee J. Richter, Vivek Prabhu, Balaji Purushothamanc, John E. Anthony, Do Y. Yoon
The phase-segregated structure and the electrical properties of thin film blends of the small-molecule semiconductor fluorinated 5,11-bis(triethylsilylethynyl) anthradithiophene with insulating binder polymers were studied for organic thin film transistor

Polymer-Fullerene Mixing in Organic Solar Cells

August 2, 2012
Author(s)
Hyun Wook Ro, Bulent Akgun, Regis J. Kline, Chad R. Snyder, Sushil K. Satija, Christopher L. Soles, Dean M. DeLongchamp, Michael F. Toney, Alexander L. Ayzner, Brendan T. O'Connor, Matthew Hammond
The mixing behavior of the hole and electron transporting materials in bulk heterojunction (BHJ) organic photovoltaic (OPV) blends plays a key role in determining the nanoscale morphology, which is believed to be a decisive factor in determining device

Measuring domain sizes and compositional heterogeneities in P3HT-PCBM bulk heterojunction thin films with 1H spin diffusion NMR spectroscopy

March 21, 2012
Author(s)
Ryan C. Nieuwendaal, Hyun Wook Ro, David Germack, Regis J. Kline, Calvin Chan, Amit K. Agrawal, David J. Gundlach, David L. VanderHart, Dean M. DeLongchamp
In this manuscript we show that 1H spin diffusion NMR is a valuable method for estimating the domain sizes in thin films of a polymer-fullerene blend for bulk heterojunction (BHJ) photovoltaics. Variations in common BHJ film processing parameters have

Nanoscale structure measurements for polymer-fullerene photovoltaics

February 3, 2012
Author(s)
Dean M. DeLongchamp, Regis J. Kline, Andrew A. Herzing
This review covers methods to measure key aspects of nanoscale structure in organic photovoltaic devices based on polymer-fullerene bulk heterojunctions. The importance of nanoscale structure to the power conversion efficiency and stability of these