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Search Publications by: Paul D. Hale (Fed)

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Displaying 1 - 25 of 231

Advancing Measurement Science for Microelectronics: CHIPS R&D Metrology Program

February 13, 2024
Author(s)
Marla L. Dowell, Hannah Brown, Gretchen Greene, Paul D. Hale, Brian Hoskins, Sarah Hughes, Bob R. Keller, R Joseph Kline, June W. Lau, Jeff Shainline
The CHIPS and Science Act of 2022 called for NIST to "carry out a microelectronics research program to enable advances and breakthroughs....that will accelerate the underlying R&D for metrology of next-generation microelectronics and ensure the

Strategic Opportunities for U.S. Semiconductor Manufacturing

August 1, 2022
Author(s)
Anita Balachandra, David Gundlach, Paul D. Hale, Kevin K. Jurrens, R Joseph Kline, Tim McBride, Ndubuisi George Orji, Sanjay (Jay) Rekhi, Sivaraj Shyam-Sunder, David G. Seiler
Semiconductors are critical to our Nation's economic growth, national security, and public health and safety. Revolutionary advances in microelectronics continue to drive innovations in communications, information technology, health care, military systems

A 110 GHz Comb Generator in a 250 nm InP HBT Technology

April 18, 2022
Author(s)
Jerome Cheron, Dylan Williams, Richard Chamberlin, Miguel Urteaga, Paul D. Hale, Rob Jones, Ari Feldman
We report a monolithic microwave integrated-circuit (MMIC) comb generator capable of producing a repetitive narrow pulse (7.1 ps pulse duration) with sharp edges (4.2 ps falling time). The circuit is designed in a 250 nm Indium Phosphide (InP)

Ultrafast waveform metrology: A first international comparison

August 24, 2020
Author(s)
Mark Bieler, Paul Struszewski, Ari Feldman, Jeffrey Jargon, Paul D. Hale, Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang
We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal bandwidth of 100 GHz have been measured by several National Metrology Institutes during the last

Physical Models and Dimensional Traceability of WR15 Rectangular Waveguide Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters

August 10, 2020
Author(s)
Jeffrey A. Jargon, Dylan F. Williams, Angela C. Stelson, Christian J. Long, Aaron M. Hagerstrom, Paul D. Hale, John R. Stoup, Eric S. Stanfield, Wei Ren
In this report, we document the models and dimensional traceability of our WR15 rectangular waveguide standards for performing multiline thru-reflect-line calibrations from 50 GHz to 75 GHz using vector network analyzers. We identify the equations used in

Channel Sounder Measurement Verification: Conducted Tests

April 15, 2020
Author(s)
Jeanne T. Quimby, Jeffrey A. Jargon, Rodney W. Leonhardt, Jake D. Rezac, Paul D. Hale, Catherine A. Remley, Amanda A. Koepke, Robert Johnk, chriss Hammerschmidt, Paul Mckenna, Irena Stange, Mike Chang
Channel modeling often provides a basis for the design and deployment of wireless technology. Engineers design systems to operate under certain expected channel conditions. Channel models are typically based on the statistics of a collection of many

Generalized source-conditions and uncertainty bounds for deconvolution problems

October 1, 2018
Author(s)
Jake D. Rezac, Andrew M. Dienstfrey, Nicholas A. Vlajic, Akobuije D. Chijioke, Paul D. Hale
Many problems in time-dependent metrology can be phrased mathematically as deconvolution problems. In such cases, measured data is modeled as the convolution of a known system response function with an unknown input signal, and the goal is to estimate the