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Search Publications by: Jeffrey Jargon (Fed)

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Displaying 101 - 121 of 121

Characterization of Broad-Band Transmission for Coplanar Waveguides on CMOS Silicon Substrates

May 1, 1998
Author(s)
V. Milanovic, Mehmet Ozgur, Donald C. DeGroot, Jeffrey Jargon, Michael Gaitan, Mona E. Zaghloul
This paper presents characteristics of microwave transmission in coplanar waveguides (CPW's) on silicon (Si) substrates fabricated through commercial CMOS foundries. Due to the CMOS fabrication, the metal strips of the CPW are encapsulated in thin films of

A Method for Comparing Vector Network Analyzers

December 1, 1997
Author(s)
Donald C. DeGroot, Roger Marks, Jeffrey A. Jargon
We present a method of comparing two distinct vector network analyzer systems by taking the differences in calibrated S-parameters over a set of test devices. The maximum magnitude of all S-parameter differences in the ensemble of data provides an estimate

Calibration Comparison Method for Vector Network Analyzers

December 1, 1996
Author(s)
Roger Marks, Jeffrey A. Jargon, John R. Juroshek
We present a technique for comparing the scattering parameter measurements made with respect to two vector network analyzer calibrations. This method determines the worst-case measurement error bounds on any calibration from a benchmark calibration

Two-Tier Multiline TRL for Calibration of Low-Cost Network Analyzers

December 1, 1995
Author(s)
Jeffrey A. Jargon, Roger Marks
We compare calibrations for use on three-sampler vector network analyzers (VNAs), which do not allow the direct applica­tion of some advanced error-correction schemes such as TRL (thru-reflect-line). Here we compare various alternatives, including an

Coaxial Line-Reflect-Match Calibration

October 1, 1995
Author(s)
Jeffrey A. Jargon, Roger Marks, Dylan F. Williams
We describe a coaxial line-reflect-match calibration that corrects for imperfections in the load used as a match standard. The method provides a practical means of obtaining accurate, wideband calibrations with compact coaxial standard sets. When our load

Electrical Measurements of Microwave Flip-Chip Interconnections

October 1, 1995
Author(s)
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen
Abstract: We apply custom calibration standards and software to the accurate on-wafer measurement of components on flip-chip coplanar-waveguide MM ICs. We characterize transmission lines, M IM capacitors, and spiral inductors and develop equivalent circuit

Microwave Characterization of Flip-Chip MMIC Components

May 1, 1995
Author(s)
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen, Y. C. Shih
Abstract: We apply custom calibration standards and software to the accurate on-wafer measurement of MIM capacitors and spiral inductors on flip-chip coplanar-waveguide MMICs. We suggest equiva1lent cir­cuit models and document their deficiencies. The

Microwave Characterization of Flip-Chip MMIC Interconnections

May 1, 1995
Author(s)
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen
Abstract: We report accurate on-wafer measurements of transmission lines on flip-chip coplanar-waveguide MMICs. The effects are difficult to predict theoretically, and, without custom standards and unique calibration software, measurements would be