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Search Publications by: Jeffrey Jargon (Fed)

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Displaying 76 - 100 of 121

Design and Characterization of a Superconducting Nonlinear Reference Device

December 5, 2003
Author(s)
James Booth, Kenneth Leong, Susan A. Schima, Jeffrey Jargon, Donald C. DeGroot
Abstract ' We describe the design, fabrication, and testing of a nonlinear reference device that has a calculable phase relationship between the fundamental signal and higher harmonic signals in the microwave range. Such a device would be useful for

RF and IF mixer optimum matching impedances extracted by large-signal vectorial measurements

October 7, 2003
Author(s)
Alessandro Cidronali, Giovanni Loglio, Jeffrey Jargon, Kate Remley, I. Magrini, Donald C. DeGroot, Dominique Schreurs, Kuldip Gupta, Gianfranco Manes
This paper introduces a new technique that allows us to measure the admittance conversion matrix of a two-port device, using a Nonlinear Vector Network Analyzer. This method is applied to extract the conversion matrix of a 0.2 micron pHEMT, driven by a 4.8

Expanding Definitions of Gain by Taking Harmonic Content into Account

September 1, 2003
Author(s)
Jeffrey Jargon, Kuldip Gupta, Alessandro Cidronali, Donald C. DeGroot
We expand the definitions of power gain, transducer gain, and available gain by taking harmonic content into account. Furthermore, we show that under special conditions, these expanded definitions of gain can be expressed in terms of nonlinear large-signal

Extraction of Conversion Matrices for P-HEMTs based on Vectorial Large-Signal Measurements

June 17, 2003
Author(s)
Alessandro Cidronali, Kuldip Gupta, Jeffrey Jargon, Kate Remley, Donald C. DeGroot, Gianfranco Manes
This paper introduces a new technique which allows us to measure the admittance conversion matrix of a two-port device, using a large signal vector network analyzer. This method is applied to extract the conversion matrix of a 0.25 um PHEMT, driven by a 4

Multiline TRL Revealed

December 5, 2002
Author(s)
Donald C. DeGroot, Jeffrey Jargon, Roger Marks
We reveal the techniques behind a successful implementation of the Multiline TRL calibration for vector network analyzers (VNAs). For the first time, this paper describes the inner workings of NIST's Multical software, an evolved, automated implementation

Repeat Measurements and Metrics for Nonlinear Model Development

June 6, 2002
Author(s)
Catherine A. Remley, Jeffrey A. Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.

Applications of Artificial Neural Networks to RF and Microwave Measurements

January 1, 2002
Author(s)
Jeffrey Jargon, Kuldip Gupta, Donald C. DeGroot
This article describes how artificial neural networks (ANNs) can be used to benefit a number of RF and microwave measurement areas including vector network analyzer (VNA) calibrations, power, and material characterization. We apply ANNs to model a variety

A Method to Compare Vector Nonlinear Network Analyzers

May 1, 2001
Author(s)
Kate Remley, Donald C. DeGroot, Jeffrey Jargon, Kuldip Gupta
We address the difficult problem of determining measurement consistency between two vector nonlinear network analyzers, a new class of stimulus-response instruments that acquire multiharmonic waveform data instead of normalized network parameters. We

Artificial Neural Network Modeling for Improved On-Wafer OSLT Calibration Standards

September 1, 2000
Author(s)
Jeffrey Jargon, Kuldip Gupta, Donald C. DeGroot
We apply artificial neural networks (ANNs) to improve the modeling of on-wafer open-short-load-thru (OSLT) standards used for calibrating vector network analyzers. The ANNs are trained with measurement data obtained from a benchmark multiline thru-reflect

NIST Unveils Status of PIM Testing

January 1, 2000
Author(s)
Jeffrey Jargon, Donald C. DeGroot
In response to requests by U.S. industry and members of the International Electrotechnical Commision, the National Institute of Standards and Technology initiated a passive intermodualtion measurement comparison for the U.S. wireless industry. The goal of

Equivalent Circuit Models for Coaxial OSLT Standards

December 1, 1999
Author(s)
Donald C. DeGroot, K. L. Reed, Jeffrey Jargon
We use a general description of transmission lines to develop analytic descriptions for offset OSLT (Open-Short-Load-Thru) standards used to calibrate vector network analyzers.

Robust SOLT and Alternative Calibrations for Four-Sampler Vector Network Analyzers

October 1, 1999
Author(s)
Jeffrey Jargon, Roger Marks, D. K. Rytting
This paper assesses the accuracy of several proposed lumped-element calibration techniques for four-sampler vector network analyzers in the face of imperfectly defined standards. We find that these methods offer a wide range of accuracies, depending on the

Complex Permittivity Determination from Propagation Constant Measurements

February 1, 1999
Author(s)
Michael D. Janezic, Jeffrey A. Jargon
This letter presents a new transmission line method for measuring the complex permittivity of dielectric materials using propagation constant measurements. In contrast to previous methods, a network analyzer calibration is unnecessary since calibrated