Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Thomas J. Silva (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 201 - 225 of 270

Different Dynamic and Static Magnetic Anisotropy in Thin Permalloy Films

July 6, 2003
Author(s)
Radek Lopusnik, John P. Nibarger, Thomas J. Silva, Zbigniew J. Celinski
The values of uniaxial anisotropy Hk in thin polycrystalline Permalloy films measured by static and dynamic methods differ by as much as a factor 1.5. The anisotropy obtained with a pulsed inductive microwave magnetometer in 2.5-100 nm thick Permalloy

Cyrogenic pulsed inductive microwave magnetometer

May 15, 2003
Author(s)
Anthony B. Kos, John P. Nibarger, Radek Lopusnik, Thomas J. Silva, Zbigniew J. Celinski
A cryogenic pulsed inductive microwave magnetometer is used to characterize the switching dynamics in thin-film materials at low temperatures and microwave frequencies. The system is contained inside a 20-cm-dia ultrahigh vacuum chamber and cooled by a

Pulsed inductive microwave magnetometer

October 1, 2002
Author(s)
Anthony B. Kos, Thomas J. Silva, Pavel Kabos
We describe the apparatus, software, and measurement procedures for a pulsed inductive microwave magnetometer (PIMM). PIMM can measure the dynamical properties of materials used in recording heads for magnetic storage applications and it can be used as a

Measurement of Dynamic Properties in Thin-Films

December 1, 2001
Author(s)
Thomas J. Silva
I present a summary of the various techniques available for the determination of response times in magnetic recording head materials. In addition, I derive useful equations for the interpretation of data in the context of the Landau-Lifshitz-Gilbert

High Frequency Measurements of CoFeHfO Thin Films

July 1, 2001
Author(s)
Stephen E. Russek, Pavel Kabos, Thomas J. Silva, Fred B. Mancoff, D Wang, Z. T. Qian, J. M. Daughton
High frequency measurements of the transverse susceptibility and damping constant of CoFeHfo thin films have been made over a frequency range of 0.1 GHz to 6 GHz as a function of film resistivity, thickness, and temperature. The films show relatively low