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Search Publications by: Pavel Kabos (Fed)

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Displaying 126 - 150 of 261

Broadband Measurements of Nanofiber Devices: Repeatability and Random Error Analysis

November 30, 2010
Author(s)
Thomas M. Wallis, Atif A. Imtiaz, SangHyun S. Lim, Pavel Kabos, Kichul Kim, Paul Rice, Dejan Filipovic
On-wafer, broadband measurements of two-port nanofiber devices were made in order to test the short-term repeatability of a widely used measurement approach that builds on established on-wafer calibration techniques. The test devices used in this study

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

November 2, 2010
Author(s)
H P. Hubner, M. Moertelmaier, Pavel Kabos, M. Fenner, C Rankl, Atif A. Imtiaz
A scanning microwave microscope (SMM) for spatially resolved capacitance measurements in the attofarad-to-femtofarad regime is presented. The system is based on the combination of an atomic force microscope (AFM) and a performance network analyzer (PNA

Contactless Approaches for RF Characterization of Metallic Nanowires

September 28, 2010
Author(s)
Kichul Kim, Paul Rice, Thomas M. Wallis, SangHyun S. Lim, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Dejan Filipovic
Two approaches for microwave characterization of nanowire (NW) conductivity are described in this paper. To remove the uncertainty associated with contacts, the NWs are either suspended above the center conductor of a coplanar waveguide (CPW) host or

Metrology of Microstructured Waveguides for Spintronic Applications

July 30, 2010
Author(s)
SangHyun S. Lim, Atif A. Imtiaz, Dazhen Gu, Pavel Kabos, Thomas Mitchell (Mitch) Wallis
Patterned permallay films as a part of a coplanar waveguide (CPW) were fabricated, and the magnetization dynamics of such structures was investigated as fundamental building blocks for magnetic spintronic devices. Anisotropic magneto-resistance (AMR)

Full-wave Evaluation of Carbon Nanotubes as Microwave Interconnects

July 25, 2010
Author(s)
Kichul Kim, Paul Rice, Pavel Kabos, Dejan Filipovic
Microwave interconnect configurations composed of single wall carbon nanotubes (CNTs) are studied in this paper. Specifically, an atomic layer deposition (ALD) enabled nano-coaxial line with individual CNTs comprising the inner conductor, CNT Goubau line

Two modes behavior of vortex oscillations in spin-transfer nanocontacts subject to in-plane magnetic fields

June 25, 2010
Author(s)
Michaela Kuepferling, Claudio Serpico, Matthew Pufall, William Rippard, Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Pavel Kabos
The field dependence of vortex oscillations in a spin-transfer metallic nanocontact, subject to in-plane, spatially uniform, external fields, is studied by measuring the power spectral density of the voltage across the device. The measured spectra as a

Application of Microwave Scanning Probes to Photovoltaic Materials

June 20, 2010
Author(s)
Kristine A. Bertness, John B. Schlager, Norman A. Sanford, Atif A. Imtiaz, Thomas M. Wallis, Joel C. Weber, Pavel Kabos, Lorelle M. Mansfield
We demonstrate that near field scanning microwave microscopy (NSMM) can be used to detect photoresponse in photovoltaic materials with potential for submicrometer resolution. In this approach, a radio-frequency scanning tunneling microscopy (RF-STM) tip is

High frequency characterization of a Schottky contact to a GaN nanowire bundle

June 16, 2010
Author(s)
Chin J. Chiang, Thomas M. Wallis, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Paul T. Blanchard, Kristine A. Bertness, Norman A. Sanford, Kichul Kim, Dejan Filipovic
A GaN nanowire (NW) Schottky contact was characterized up to 10 GHz. Using a calibration procedure and circuit model a capacitance-voltage (CV) curve was obtained, from which a carrier concentration was calculated for the first time. These results

Modeling and metrology of metallic nanowires with application to microwave interconnects

May 23, 2010
Author(s)
Kichul Kim, Thomas M. Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Jintao Zhang
Abstract: Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling are benchmarked using a set of coplanar waveguide (CPW) test devices with microwire Au

Near-Field Antenna as a Scanning Microwave Probe for Characterization of Materials and Devices

April 12, 2010
Author(s)
Atif A. Imtiaz, Thomas M. Wallis, SangHyun S. Lim, Jonathan Chisum, Zoya Popovic, Pavel Kabos
The Scanning Microwave Probe (SMP) is emerging as an important broadband metrology tool for characterizing the materials and devices in the micron and sub-micron length scales in the frequency range of 10 MHz to 110 GHz. In this document we establish three

Broadband Characterization of Individual Platinum Nanowires

March 7, 2010
Author(s)
Kichul Kim, Thomas M. Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Dejan Filipovic
Conductivity and contact resistance of 100 nm and 250 nm diameter platinum (Pt) nanowires (NWs) are investigated computationally and experimentally. Finite element method based full-wave modeling and circuit simulations are used in conjunction with