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Search Publications by: Pavel Kabos (Fed)

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Displaying 151 - 175 of 261

Micromachined resonators of high Q-factor based on atomic layer deposited alumina

September 24, 2009
Author(s)
Atif A. Imtiaz, Yuan-Jen Chang, Jason M. Gray, Dragon Seghete, Steven George, Thomas Mitchell (Mitch) Wallis, Pavel Kabos, Charles T. Rogers, Victor M. Bright
In this paper, atomic layer deposited (ALD) alumina (Al2O3) has been demonstrated as the structural material for a micro-resonator for the first time.  An electrostatically actuated micro-bridge made of chromium (Cr) coated ALD Al2O3 was used as a

Three-Magon Splitting and Confluence Processes for Magnetostatic Backward Volume-Spin-Wave Excitations in Yttrium Iron Garnet Films

April 27, 2009
Author(s)
Pavel Kabos, Cesar O. Ordonez-Romero, Boris A. Kalinikos, Pavol Krivosik, Wei Tong, Carl E. Patton
Brillouin light scattering (BLS) has been used to observe and confirm the existence of nonlinear three magnon splitting and confluence processes for propagating spin waves in the magnetostatic backward volume wave (MSBVW) configuration. Wave vector and

Wideband measurement of extreme impedance with a multistate reflectometer

December 12, 2008
Author(s)
Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A. Ginley, Thomas M. Wallis, Atif A. Imtiaz, Pavel Kabos
Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We

Calibrated Broadband Electrical Characterization of Nanowires

June 8, 2008
Author(s)
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Kristine A. Bertness, Norman Sanford, Paul T. Blanchard, Pavel Kabos
A technique is presented for the broadband electrical characterization of nanowires. The technique relies on established on-wafer calibration methods as well as a direct measurement of the capacitive coupling that is in parallel with the nanowire

Near-field microwave microscope measurements to characterize bulk material properties

June 12, 2007
Author(s)
Atif A. Imtiaz, Thomas Baldwin, Hans T. Nembach, Thomas M. Wallis, Pavel Kabos
We measured bulk dielectric (Fused Silica), semiconductor (Silicon) and metal (Copper), with a Near-field Scanning Microwave Microscope (NSMM). We use three bulk materials to test the existing quasi-static theoretical approach to de-embed the materials

Metrology for High-Frequency Nanoelectronics

March 27, 2007
Author(s)
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Paul Rice, Pavel Kabos
Two metrological tools for high frequency measurements of nanoscale systems are described: (i) tow/N-port analysis of nanoscale devices as well as (ii) near-field scanning microwave microscopy (NSMM) for materials characterization. Calibrated two/N-port

Broadband Electrical Characterization of Multiwalled Carbon Nanotubes and Contacts

March 22, 2007
Author(s)
Paul Rice, T. M. Wallis, Stephen E. Russek, Pavel Kabos
We have welded an individual multiwalled carbon nanotube (MWNT) onto a microlithographically-patterned coplanar waveguide (CPW) and measured the electrical response of the nanotube and the contacts from 100 MHz to 24 GHz. The MWNT was welded to the CPW in

Broadband Electrical Characterization of Multiwalled Carbon Nanotubes and Contacts

March 22, 2007
Author(s)
Thomas M. Wallis, Stephen E. Russek, Pavel Kabos, Paul Rice
The electrical response of an individual multiwalled carbon nanotube (MWNT) and its contacts, welded to a coplanar waveguide (CPW), was measured up to 24 GHz using a technique that removes environment effects. This is the first time MWNT contact effects

Microwave Resonances in Nanogranular (Fe

October 2, 2006
Author(s)
Massimo Pasquale, Sergio Perero, Giorgio Bertotti, Pavel Kabos
We have analyzed the microwave behavior of soft nanogranular (Fe 0.7uCo 0.3u) 71uB 22uNi films with thickness of 136, 195 and 236 nm which present a dc relative permeability from 60 to 280, a resistivity of 8 to 9×10 7d Ω}m and a zero-field double

Phase Velocity in Resonant Structures

October 1, 2006
Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Derik Love, Thomas Mitchell (Mitch) Wallis, Christopher L. Holloway, Pavel Kabos
In this paper we present a simple experimental procedure for studying the phase velocity behavior of a metafilm with tunable material properties. Using this approach we have studied the phase-velocity behavior of a metamaterial under different conditions