January 1, 2011
Author(s)
Nathan D. Orloff, Jordi Mateu, Arkadiusz C. Lewandowski, Eduard Rocas, Joshua P. King, Dazhen Gu, Juan C. Collado Gomez, Ichiro Takeuchi, Xiaoli Lu, James C. Booth
We present a method to obtain a broadband on wafer calibration from 45 MHz to 40 GHz for variable temperature, which requires three standards: a thru-reflect, and series-resistor. The maximum error of this technique compared to a benchmark 9 standard