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Search Publications by: Gretchen Greene (Fed)

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Displaying 1 - 9 of 9

Advancing Measurement Science for Microelectronics: CHIPS R&D Metrology Program

February 13, 2024
Author(s)
Marla L. Dowell, Hannah Brown, Gretchen Greene, Paul D. Hale, Brian Hoskins, Sarah Hughes, Bob R. Keller, R Joseph Kline, June W. Lau, Jeff Shainline
The CHIPS and Science Act of 2022 called for NIST to "carry out a microelectronics research program to enable advances and breakthroughs....that will accelerate the underlying R&D for metrology of next-generation microelectronics and ensure the

The NIST Plan for Providing Public Access to Results of Federally Funded Research

October 2, 2023
Author(s)
Katherine E. Sharpless, Regina L. Avila, Ronald F. Boisvert, A Kirk Dohne, James Fowler, Rachel B. Glenn, Gretchen Greene, Robert Hanisch, Andrea Medina-Smith, Alan Munter, Julie Petrousky, Yuri Ralchenko, Carolyn D. Rowland, James A. St Pierre, Adam Wunderlich, Jon Zhang
In 2013 White House Office of Science and Technology Policy (OSTP) issued a memo, "Increasing Access to the Results of Federally Funded Scientific Research." In response, he National Institute of Standards and Technology (NIST) developed a public access

A Roadmap for LIMS at NIST Material Measurement Laboratory

April 11, 2022
Author(s)
Gretchen Greene, Jared Ragland, Zachary Trautt, June W. Lau, Raymond Plante, Joshua Taillon, Adam Abel Creuziger, Chandler A. Becker, Joe Bennett, Niksa Blonder, Lisa Borsuk, Carelyn E. Campbell, Adam Friss, Lucas Hale, Michael Halter, Robert Hanisch, Gary R. Hardin, Lyle E. Levine, Samantha Maragh, Sierra Miller, Chris Muzny, Marcus William Newrock, John Perkins, Anne L. Plant, Bruce D. Ravel, David J. Ross, John Henry J. Scott, Christopher Szakal, Alessandro Tona, Peter Vallone
Instrumentation generates data faster and in higher quantity than ever before, and interlaboratory research is in historic demand domestically and internationally to stimulate economic innovation. Strategic mission needs of the NIST Material Measurement

Building Open Access to Research (OAR) data infrastructure at NIST

July 8, 2019
Author(s)
Gretchen R. Greene
As a National Metrology Institute (NMI), the National Institute of Science and Technology (NIST) scientists, engineers and technology experts conduct research across a full spectrum of physical science domains. This is performed as a public service within