Avramov, S.
, Koffman, A.
, Oldham, N.
and Waltrip, B.
(2000),
The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=16695
(Accessed December 26, 2024)
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The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic
Published
Author(s)
S. Avramov, , ,
Abstract
A joint effort between the U.S. Naval Academy and the National Institute of Standard and Technology (NIST) resulted in the development of a method to characterize the capacitance and dissipation factor of a set of commercial standard four terminal-pair (4TP) capacitors. The method depends on network analyzer impedance measurements at high frequencies (40 MH-200 MHz) and a regression of these measurements down to the frequency range of 10 MHz-1 kHz. This paper provides an analysis of the sensivitivity of the refression parameters and the high-frequency impedance measurements.Citation
IEEE Transactions on Instrumentation and Measurement
Volume
49
Issue
2
Pub Type
Journals
Download Paper
Keywords
capacitance, capacitance characterization, capacitance prediction, dissipation factor, four-terminal pair, frequency measurement range, network, analyzer prediction, regression parameters
Citation
Issues
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Created March 31, 2000, Updated October 12, 2021