Schlaf, R.
, Emirov, Y.
, Bieber, J.
, Sikder, A.
, Kohlscheen, J.
, Walters, D.
, Islam, M.
, Metha, B.
, Ren, Z.
, Shofner, T.
, Rossi, B.
and Cresswell, M.
(2002),
Using Carbon Nanotube Cantilevers in Scanning Probe Metrology, Proc. Intl. Soc. for Optical Engineering (SPIE), Santa Clara, CA, USA
(Accessed December 26, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Using Carbon Nanotube Cantilevers in Scanning Probe Metrology
Published
Author(s)
R Schlaf, Y Emirov, J A. Bieber, A Sikder, J Kohlscheen, D A. Walters, M R. Islam, B Metha, Z F. Ren, T L. Shofner, B B. Rossi,
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE)
Conference Dates
March 3-8, 2002
Conference Location
Santa Clara, CA, USA
Conference Title
SPIE - The International Society for Optical Engineering
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 2002, Updated October 12, 2021