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Using a High-Value Resistor in Single-Electron Counting Measurements

Published

Author(s)

Randolph Elmquist, Neil M. Zimmerman, William Huber

Abstract

An experiment using a high-value cryogenic resistor is proposed, with the aim of improving the experimental link between three quantum electrical standards. This technique is new in its approach and does not require feedback from either a voltage detector or a current detector. Performance is limited by fundamental resistor and SQUID detector noise.
Proceedings Title
Conference Digest
Conference Dates
June 16-21, 2002
Conference Location
Ottawa, 1, CA
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

Josephson Effect, Quantum Hall effect, Resistance Measurements, Single-electron tunneling

Citation

Elmquist, R. , Zimmerman, N. and Huber, W. (2002), Using a High-Value Resistor in Single-Electron Counting Measurements, Conference Digest, Ottawa, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=21883 (Accessed December 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2002, Updated October 12, 2021