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Nanotechnology

Nanomaterials

News and Updates

Events

Projects and Programs

MNP Metrology Program

Microplastic and Nanoplastic Metrology

Ongoing
The Micro and Nanoplastic (MNP) Metrology Project aims to develop a toolbox of methods for size-based separations from complex matrices, chemical characterization protocols, and test materials necessary to enable quantification of micro- and nano-sized plastic particles, a need articulated by our
The SPMforAMP project develops novel SPM methods

Scanning Probe Microscopy for Advanced Materials and Processes

Ongoing
With a nanometer-sharp probe capable of delicate interaction with a limitless array of materials, SPM methods such as Atomic Force Microscopy (AFM) can aid in characterizing a wide range of materials in diverse environments from vacuum to biological serums. The atomic force microscope is operated in
Materials Extrusion Additive Manufacturing

Polymer Additive Manufacturing and Rheology

Ongoing
We are measuring the fundamental processes and material parameters that are critical to understanding and furthering polymers-based AM. These efforts will aid the AM ecosystem through better online monitoring capabilities and developing strategies for materials optimization. In situ measurements of

Publications

Software

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

Awards

Vincent Hackley Honored by ASTM

In recognition of consistent dedication and outstanding service to ASTM Committee E56 on Nanotechnology since the committee’s inception in