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Metrology

Dimensional metrology

News and Updates

artifact

Back to the Future: Gear Edition

As mechanical objects, gears have been around for so long that people may take them for granted. But gears are sophisticated parts that play a vital role in

Projects and Programs

Laser tracker calibration in Tape Tunnel Facility

Advanced Dimensional Measurement Systems

Ongoing
New dimensional measurement technologies provide significant benefits to industry such as increasing measurement throughput, enabling new manufacturing process (such as additive manufacturing) and providing more detailed part information for manufacturing process improvement. However, before

Qualification for AM Feedstocks, Machines and Processes

Completed
Objective - To develop, utilize, and analyze test methods and protocols for characterizing the feedstocks, machines, and processes in metal-based additive manufacturing to enable optimum usage and to reduce the cost and time needed for qualification. What is the Technical Idea? Qualification of AM

Data Integration and Management for Additive Manufacturing

Completed
Objective Data plays the most critical role in linking AM lifecycle and value chain activities and streamlining the AM development process. While the AM data from a single build is essential for establishing part traceability, when methodically collected, the full processing history of thousands of
block

SI Length and Traceability

Ongoing
Laser interferometry, which measures distances in terms of light wavelength, provides the backbone of top-level length metrology in industry and science. This project develops techniques to facilitate the tie between interferometer-based length measurements and the SI definition of length (in terms

Publications

Tools and Instruments

Laser Doppler Vibrometer located in 218/D012 (Group 643.09)

Laser Doppler Vibrometer Microscope

Since 2006, the Nanomechanical Properties Group has pioneered the use of Laser Doppler Vibrometry (LDV) to calibrate the stiffness of AFM cantilevers using the
Examples of work in the Precision Imaging Facility.  (a) STEM image of a crack (dislocation) formed during growth of an AlGaN shell around a GaN nanowire, and (b) FIB fabrication of an AFM tip with a GaN nanowire contact point.

Precision Imaging Facility

The Precision Imaging Facility (PIF) is a cooperative research facility at the National Institute of Standards and Technology (NIST) dedicated to the