The International Field Emission Society (IFES) is an international scientific society that aims to promote high field nanoscience and atom probe microscopy.
The IFES is governed by its own charter that provides for an International Steering Committee (ISC) elected by the members. The Society's main duty is to run the International Field Emission Symposium that has recently been renamed Atom Probe Tomography & Microscopy (APT&M).
This Symposium has been in existence since 1952 and currently meets every two years. APT&M 2018 will be held from June 10 to June 15, 2018 in the United States at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, just outside of Washington, D.C. It was at the 14th Field Emission Symposium, held at the National Bureau of Standards (now NIST) in 1967, that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope.
IFES Steering Committee
David Larson
|
2014
|
President
|
Cameca, Inc, Madison, USA |
François Vurpillot |
2012
|
Vice-President
|
Groupe de Physique des Matériaux CNRS - UMR 6634 University of Rouen, Saint-Etienne du Rouvray, France |
Gregory Thompson |
2012 |
Secretary |
The University of Alabama, Tuscaloosa, AL, USA |
Michael Moody |
2012 |
Treasurer |
Department of Materials, University of Oxford, Oxford, UK |
July Cairney |
2014 |
|
Australian Centre for Microscopy and Microanalysis The University of Sydney, Sydney, Australia |
Mattias Thuvander
|
2014 |
|
Chalmers University of Technology, Gotenburg, Sweden |
Stephan Gerstl |
2012 |
|
EMEZ, ETH, Zurich, Switzerland |
Gang Sha |
APT&M 2016 |
|
Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mian Yang, China |
Ross Marceau |
APT&M 2016 |
|
Deakin University, Institute for Frontier Materials, Geelong, Australia |
Baptiste Gault |
APT&M 2016 |
|
MPIE, Düsseldorf, Germany |
Program and Planning Committee