Dr. Michael T. Postek is an Assistant Professor at the University of South Florida. He is an internationally recognized expert in nanometrology with emphasis on SEM and semiconductor CD. Previously, Dr. Postek was the Chief of the Precision Engineering Division at NIST where he led research and measurement service programs in dimensional metrology. He also served as the National Program Manager for the Nanomanufacturing Program in the Manufacturing Engineering Laboratory and retired as a senior scientist in the Engineering Physics Division of the Physical Measurement Laboratory. He developed and taught microscopy short courses at the University of Maryland for over 14 years and more recently at the University of Hartford and with Hitachi High Technologies America. Dr. Postek holds over 300 publications and authorship of the book “Scanning Electron Microscopy – A Student Handbook” in addition to being a recognized Fellow for both the SPIE and MSA societies.
John J. Kasianowicz, Ph.D. Dr. Kasianowicz is a senior physical scientist in the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He received a B.A. with distinction in Physics from Boston University, a M.A. in Physics and a Ph.D. in Physiology & Biophysics from SUNY at Stony Brook. His current research interests include ion transport through membranes, ion channel structure-function, bioenergetics, novel sensing systems, single molecule detection and characterization, the physics of polymer structure and transport, novel methods for RNA/DNA characterization, and model systems for studying viral infection and protein secretion. Previously, he served as leader of the Biomolecular Materials Group, also at NIST. Prior to his staff appointments at NIST, Dr. Kasianowicz was an Office of Naval Research post-doctoral fellow at the NIH and a National Academy of Sciences/National Research Council Research Associate at NIST. He is also a visiting adjunct professor at Columbia University.