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Paul D. Hale (Fed)
Deputy Director, CHIPS Metrology
Prior to joining CHIPS Metrology Program, Dr. Hale was Chief of the RF Technology Division. During Dr. Hale’s career at NIST, his work has focused on providing NIST traceability that supports the microwave, high-speed electronics, and optoelectronics industries, including the development of seven NIST measurement services in those areas. Dr. Hale was also the technical co-lead on the National Advanced Spectrum and Communication Test Network (NASCTN) 3.5 GHz radar waveform measurements in 2016 and was technical lead on the NASCTN test plan development for measuring the user equipment (UE) aggregate long term evolution (LTE) emissions in the AWS-3 Band in 2017.
Dr. Hale is a Fellow of the IEEE, an Ex Officio member of the International Electronics Manufacturing Initiative (iNEMI) Board of Directors, chair of the RF working group (GT-RF) of the Consultative Committee on Electromagnetics at the BIPM, and a member of the Industrial Advisory Committee for the Colorado School of Mines Electrical Engineering Department. He was an Associate Editor of Optoelectronics/ Integrated optics for the IEEE Journal of Lightwave Technology from June 2001 until March 2007. He has authored or coauthored over 110 technical publications (i10-index=72, Google Scholar, Jan. 18, 2024).
Awards
Dr, Hale has received the Department of Commerce Bronze, Silver, and Gold Awards, the Allen V. Astin Measurement Science Award, two ARFTG Best Paper Awards, and the NIST Electrical Engineering Laboratory's Outstanding Paper Award