Thurber, W.
, Lewis, D.
and Bullis, W.
(1973),
Resistivity and carrier lifetime in gold-doped silicon:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.73-128
(Accessed November 9, 2024)
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Resistivity and carrier lifetime in gold-doped silicon:
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- NBS IR 73-128
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NBS IR 73-128
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NIST Pubs
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Created January 1, 1973, Updated May 19, 2023