Marshall, J.
, Scace, R.
and Baylies, W.
(2006),
MEMS length and strain round robin results with uncertainty analysis:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7291
(Accessed November 8, 2024)
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MEMS length and strain round robin results with uncertainty analysis:
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- NIST IR 7291
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NIST IR 7291
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NIST Pubs
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Created January 1, 2006, Updated May 20, 2023