Latent Testing Workshop 2009

The workshop was held at the National Institute of Standards and Technology in Gaithersburg, Maryland on March 19 & 20, 2009. Here is a link to the Latent Fingerprint Testing  2009 workshop presentations. 

This workshop served two purposes:

1. To provide a venue to present and discuss the results of the recently completed NIST Evaluation of Latent Fingerprint Technologies (ELFT) Phase II, which evaluated the performance of lights-out encoding and matching of latent images. Discussion of future topics and directions for lights-out testing will be discussed and feedback solicited.

2. To provide a venue for the next test, the NIST Evaluation of Latent Fingerprint Technologies: Extended Feature Sets (ELFT-EFS). The purpose of this evaluation was to determine the effectiveness of human latent examiner-marked fingerprint features on automated latent fingerprint search accuracy, specifically with respect to the comparative accuracy of image-only searches, image+minutiae searches, and image+extended feature searches. The workshop was held to provide input to NIST in the planning of this evaluation of matcher algorithms using various combinations of Extended Friction Ridge Features.

Sponsors

The workshop was sponsored by the Department of Homeland Security, Science and Technology Directorate(S & T) and the Federal Bureau of Investigation (FBI). 

The workshop was organized and sponsored by the Information Access Division of the Information Technology Laboratory (ITL) at the National Institute of Standards and Technology (NIST).

ELFT Links

Overview
ELFT-EFS
ELFT-EFS Eval1 Preliminary Report
ELFT Phase II Final Report