Zhu, B.
, Suehle, J.
, Chen, Y.
and Bernstein, J.
(2002),
Negative Bias Temperature Instability of Deep Sub-Micron p-MOSFETs Under Pulsed Bias Stress, Proc., Integrated Reliability Workshop, Lake Tahoe, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30882
(Accessed August 31, 2024)