Chi, P.
, Simons, D.
and Roitman, P.
(1988),
Artifacts Observed in Oxygen Profiles of SIMOX Samples by Secondary Ion Mass Spectrometry, Microbeam Analysis - l988, Proc. 22nd Annual Conf. Materials Analysis Society, Milwaukee, WI, USA
(Accessed July 17, 2024)
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Artifacts Observed in Oxygen Profiles of SIMOX Samples by Secondary Ion Mass Spectrometry
Published
Author(s)
, ,
Proceedings Title
Microbeam Analysis - l988, Proc. 22nd Annual Conf. Materials Analysis Society
Conference Dates
August 8-2, 1988
Conference Location
Milwaukee, WI, USA
Pub Type
Conferences
Citation
Issues
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Created December 30, 1988, Updated October 12, 2021