Young, M.
(1983),
Objective measurement and characterization of scratch standards, Proc. Intl. Soc. for Optical Engineering (SPIE), [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12626
(Accessed November 8, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Objective measurement and characterization of scratch standards
Published
Author(s)
M. Young
Abstract
The manufacture of scratch standards for use with MIL-0-13830A has been hampered by the lack of an objective measurement technique, The U.S. National Bureau of Standards has therefore undertaken a comprehensive program to provide quantitative measurements of the light scattered by the scratches and to correlate them with assessments made by trained observers. In this paper, I apply scalar diffraction theory to developing design criteria for a polar scanning apparatus, describe an apparatus that includes a novel optical system, and show scans from one full set of secondary standards. Comparing these scans with the visual assessments is not straightforward.Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE)
Volume
362
Issue
1
Pub Type
Conferences
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 1, 1983, Updated February 17, 2017