Black, D.
, Woicik, J.
, Erdtmann, M.
and Currie, M.
(2006),
Imaging Defects in Strained Silicon Thin Films by X-ray Topography, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854299
(Accessed October 31, 2024)
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Imaging Defects in Strained Silicon Thin Films by X-ray Topography
Published
Author(s)
, , M Erdtmann, M T. Currie
Citation
Applied Physics Letters
Volume
88
Issue
22
Pub Type
Journals
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 29, 2006, Updated February 19, 2017