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Displaying 601 - 625 of 2606

Synchrotron X-Ray Microbeam Diffraction Measurements of Full Elastic Long Range Internal Strain and Stress Tensors in Commercial-Purity Aluminum Processed by Multiple Passes of Equal-Channel Angular Pressing

April 23, 2016
Author(s)
Thien Q. Phan, Lyle E. Levine, I-Fang Lee, Jonathan Z. Tischler, Ruqing Xu, Yi Huang, Terrance G. Langdon, Michael E. Kassner
Synchrotron X-ray microbeam diffraction was used to measure the full elastic long range internal strain and stress tensors of low dislocation density regions within the submicrometer grain/subgrain structure of equal-channel angular pressed (ECAP) AA1050

Engineered metal nanoparticles in the sub-nanomolar levels kill cancer cells

April 18, 2016
Author(s)
Yasmine C. Daniels, William A. MacCrehan, Shinichiro Muramoto, Gheorghe NMN Stan, Vitaly Vodyanoy, Oleg Pustovyy
Zinc and copper metal nanoparticles were produced from bulk metal rods by an underwater high-voltage discharge method. The metal nanoparticles, with estimated diameters of 1 nm to 2 nm, were determined to be more than 85 % non-oxidized. Exposure of rat RG2

Towards Establishing Compact Imaging Spectrometer Standards

March 31, 2016
Author(s)
David W. Allen, Elmer T. Slonecker, Ronald G. Resmini
Remote sensing science is currently undergoing a tremendous expansion in the area of hyperspectral imaging (HSI) technology. Spurred largely by the explosive growth of Unmanned Aerial Vehicles (UAV), sometimes called Unmanned Aircraft Systems (UAS), or

Virtual rough samples to test 3D nanometer-scale SEM stereo photogrammetry

March 22, 2016
Author(s)
John S. Villarrubia, Vipin N. Tondare, Andras Vladar
The combination of SEM for high spatial resolution, images from multiple angles to provide 3D information, and commercially available stereo photogrammetry software for 3D reconstruction offers promise for dimensional metrology in 3D. A method is described

Centroid and Orientation Precision of Localization Microscopy

March 11, 2016
Author(s)
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and motion

A Review and Survey of Metrology Outreach Efforts in Post-Secondary Education

March 1, 2016
Author(s)
Georgia L. Harris, Maria Isabel Pena
The paper presents a brief history and background of metrology outreach efforts to colleges and universities. It also includes a summary of a 2015 international educational survey used in part to assess colleges and universities that have measurement

Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior

March 1, 2016
Author(s)
Marlin E. Kraft, Randolph E. Elmquist, Gert Rietveld, Jan van der Beek, Alessandro Mortara, Beat Jeckelmann
The low-ohmic resistance measurement capabilities of the Van Swinden Laboratorium, National Institute of Standards and Technology, and the Federal Office of Metrology (METAS) were compared using a set of resistors with values 100 mΩ, 10 mΩ, 1 mΩ, and 100

Method Validation and Standards in Hydrogen/Deuterium Exchange Mass Spectrometry

March 1, 2016
Author(s)
Jeffrey W. Hudgens, Richard Y. Huang, Emma D'Ambro
The chapter examines method validation and measurement standards for measuring protein dynamics by hydrogen/deuterium exchange mass spectrometry. Topics examined include the rationale for a reference measurement system for HDX-MS, attaining high accuracy

Optimization of Registration Performance Metrics

February 25, 2016
Author(s)
Marek Franaszek, Geraldine Cheok
Perception systems are a very important component of automation and robotics. These systems localize objects in its local coordinate frame and the data has to be available for use in another coordinate frame. This requires that the data be transformed from

Coil motion effects in watt balances: a theoretical check

February 10, 2016
Author(s)
Stephan Schlamminger, Shisong Li, Darine El Haddad, Frank C. Seifert, Leon S. Chao, Jon R. Pratt
A watt balance is a precision apparatus for the measurement of the Planck constant that has been proposed as a primary method for realizing the unit of mass in a revised International System of Units. In contrast to an ampere balance, which was
Displaying 601 - 625 of 2606