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Displaying 1151 - 1175 of 1560

Microwave Characterization of Flip-Chip MMIC Interconnections

May 1, 1995
Author(s)
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen
Abstract: We report accurate on-wafer measurements of transmission lines on flip-chip coplanar-waveguide MMICs. The effects are difficult to predict theoretically, and, without custom standards and unique calibration software, measurements would be

LRM Probe-Tip Calibrations Using Nonideal Standards

February 1, 1995
Author(s)
Dylan F. Williams, Roger Marks
The line-reflect-match calibration is enhanced to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate length

Compensation for Substrate Permittivity in Probe-Tip Calibration

December 1, 1994
Author(s)
Dylan F. Williams, Roger Marks
We demonstrate a method of compensation for the effect of substrate permittivity on coplanar waveguide probe-tip scattering parameter calibrations, modeling the effect as a capacitance at the probe tip. Comparison to on-wafer multiline TRL calibration
Displaying 1151 - 1175 of 1560