January 1, 2005
Author(s)
Norman Sanford, Anneli Munkholm, Mike A. Krames, Alexander J. Shapiro, Igor Levin, Albert Davydov, Safak Sayan, L Wielunski, T E. Madey
The refractive index and birefringence of InxGa1'xN films grown on GaN layers were measured by prism coupling used in conjunction with multilayer optical waveguide analysis. Samples with x = 0.036, 0.049, 0.060, and 0.066 were examined at the separate