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Search Publications by: Pavel Kabos (Fed)

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Displaying 76 - 100 of 261

GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy

September 25, 2014
Author(s)
Joel Weber, Paul T. Blanchard, Aric Sanders, Jonas Gertsch, Steven George, Samuel Berweger, Atif A. Imtiaz, Thomas Mitchell (Mitch) Wallis, Kris A. Bertness, Pavel Kabos, Norman A. Sanford, victor bright
We report on the fabrication of a GaN nanowire probe for near-field scanning microwave microscopy. The probe has a capacitive resolution of 0.03 fF, surpassing that of a commercial Pt tip. Imaging of MoS2 sheets found the probe to be immune to surface

Software for Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields*

September 1, 2014
Author(s)
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, Pavel Kabos, David R. Novotny, James C. Booth, James A. Liddle
This software package was developed to analyze microwave cavity perturbation data in order to determine material dielectric properties. Example software is provided to assist with data acquisition and organization. Specifically, it is de-signed to be used

Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields

July 23, 2014
Author(s)
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, James C. Booth, David R. Novotny, James A. Liddle, Pavel Kabos
The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. To

Gallium Nitride Nanowire Probe for Near-Field Scanning Microwave Microscopy

January 15, 2014
Author(s)
Joel C. Weber, Paul T. Blanchard, Aric W. Sanders, Atif A. Imtiaz, Thomas M. Wallis, Kevin J. Coakley, Kristine A. Bertness, Pavel Kabos, Norman A. Sanford, Victor M. Bright
We report on the fabrication of a GaN nanowire probe for near-field scanning microwave microscopy. A single nanowire was Pt-bonded to a commercial Si cantilever prior to evaporation of a Ti/Al coating to provide a microwave signal pathway. Testing over a

Radio-Frequency and DC Electrical Characterization on a Modular MEMS Mechanical Test Platform for Nanomaterials

June 16, 2013
Author(s)
J. J. Brown, Thomas Mitchell (Mitch) Wallis, Pavel Kabos, Kristine A. Bertness, Norman Sanford, Victor Bright
In order to enable radio frequency (RF) data collection from a micromechanical system designed to strain nanomaterials, a coplanar electrical waveguide has been integrated with an actuated microscale stage. RF (100 MHz to 20 GHz) admittance measurements

Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals

June 1, 2013
Author(s)
Chukwudi A. Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S. Obeng
In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV daisy

Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis

May 28, 2013
Author(s)
Chukwudi A. Okoro, Yaw S. Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity in

Spatially-Resolved Dopant Characterization with a Scanning Microwave Microscope

March 25, 2013
Author(s)
Thomas M. Wallis, Atif A. Imtiaz, Alexandra E. Curtin, Pavel Kabos, Matthew D. Brubaker, Norman A. Sanford, Kristine A. Bertness
The scanning microwave microscope (SMM) is a tool for spatially-resolved microwave characterization of nanoelectronic materials and devices. The microscope incorporates a sharp, near-field probe, which measures local changes in reflected microwave signals

Near-Field Scaning Microwave Microscope (NSMM)

December 31, 2012
Author(s)
Atif A. Imtiaz, Thomas M. Wallis, Pavel Kabos
Electromagnetic waves in the microwave frequency range are an essential tool for the investigation of material and device properties across a broad range of applications. Examples of materials of interest include: ferroelectric materials, ferromagnetic

Microwave Behavior of polymer bonded Iron oxide nanoparticles

November 1, 2012
Author(s)
Pavel Kabos, A Caprile, Coisson Marco, F Fiorillo, O M. Manu, E. S. Olivetti, M. A. Olariu, Pasquale Massimo, V. A. Scarlatache
Samples composed of a polymer matrix were loaded with different fractions from 0 to 30% of Fe oxide magnetic nanoparticles with an average size ranging from 50 to 25 nm. The permittivity and permeability of the composites were determined upon a very wide

Measurement Science for "More-Than-Moore" Technology Reliability Assessments

October 12, 2012
Author(s)
Chukwudi A. Okoro, Jungjoon Ahn, Meagan V. Kelso, Pavel Kabos, Joseph Kopanski, Yaw S. Obeng
In this paper, we will present an overview of metrology issues and some of the techniques currently under development in our group at NIST, aimed at understanding some of the potential performance limiting issues in such highly integrated systems. We will

Microwave Measurements and Systematic Circuit-Model Extraction of Nanowire Metal Semiconductor Field Effect Transistors

August 24, 2012
Author(s)
Dazhen Gu, Thomas M. Wallis, Pavel Kabos, Paul T. Blanchard, Kristine A. Bertness, Norman A. Sanford
We present detailed on-wafer scattering parameter measurements and equivalent circuit modeling of metal semiconductor field effect transistor (MESFET) that incorporates a GaN nanowire (NW). A systematic procedure is established to extract intrinsic model