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Publications

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This publications database includes many of the most recent publications of the National Institute of Standards and Technology (NIST). The database, however, is not complete. Additional publications are added on a continual basis.

If you have difficulties in locating a specific publication, please contact reflib [at] nist.gov (reflib[at]nist[dot]gov) and provide any information you may have, including title, author, publication series, or date published.

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Recent Publications

Fire Data Generator (FD-Gen) v1.0.0

Author(s)
Hongqiang Fang, Wai Cheong Tam
This document serves as the documentation for the Fire Data Generator (FD-Gen), an automated tool designed to streamline the creation of multiple Fire Dynamics

JBO Special Issue on Hyperspectral Imaging

Author(s)
Baowei Fei, Jeeseong Hwang, Matija Milanic
The editors introduce a Journal of Biomedical Optics (JBO) feature issue on "Hyperspectral imaging." The special issue features a number of important research

Product ion distributions using H3O+ proton-transfer-reaction time-of-flight mass spectrometry (PTR-ToF-MS): mechanisms, transmission effects, and instrument-to-instrument variability

Author(s)
Michael Link, Megan Claflin, Christina Cecelski, Ayomide Akande, Delany Kilgour, Paul Heine, Matthew Coggon, Chelsea Stockwell, Andrew Jensen, Jie Yu, Han Huyhn, Jenna Ditto, Carnsten Warneke, William Dresser, Keighan Gemmell, Spiro Jorga, Rileigh Robertson, Joost de Gouw, Timothy Bertram, Jonathan Abbatt, Nadine Borduas-Dedekind, Dustin Poppendieck
Proton-transfer-reaction mass spectrometry (PTR-MS) using hydronium ion (H3O+) ionization is widely used for the measurement of volatile organic compounds (VOCs

Using Business Impact Analysis to Inform Risk Prioritization and Response

Author(s)
Stephen Quinn, Nahla Ivy, Julie Anne Chua, Matthew Barrett, Larry Feldman, Daniel Topper, Greg Witte, Robert Gardner
While business impact analysis (BIA) has historically been used to determine availability requirements for business continuity, the process can be extended to
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